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Title:
METHOD AND APPARATUS FOR OPTICAL INSPECTION OF METALS, ETC.
Document Type and Number:
Japanese Patent JP2002202113
Kind Code:
A
Abstract:

To provide a method and an apparatus for optical inspection of metals, etc., which quickly and reliably discriminates fine flaws, etc., appearing on the surface of a metal, etc., during working thereof and inspects the surface at a high precision.

The optical surface inspection method of inspecting the irregularities condition of the surface of a rolled or drawn metal, etc., uses an illuminator for radiating a light having a fringe pattern of bright zones and dark zones alternately arranged with equal spacings on the surface of a metal, etc., under inspection, and sets so that the arranging direction of the fringe pattern is equal to the rolling or drawing direction.


Inventors:
OKINO YUKITOSHI
Application Number:
JP2000400883A
Publication Date:
July 19, 2002
Filing Date:
December 28, 2000
Export Citation:
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Assignee:
TOSHIBA LIGHTING & TECHNOLOGY
International Classes:
G01B11/30; B21C51/00; G01N21/892; (IPC1-7): G01B11/30; B21C51/00; G01N21/892
Attorney, Agent or Firm:
Takashi Honda