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Title:
METHOD AND APPARATUS FOR PRODUCING UNIFORM PROCESSING RATE
Document Type and Number:
Japanese Patent JP2012104496
Kind Code:
A
Abstract:

To provide an antenna arrangement for generating an rf electromagnetic field distribution at a plasma generating region in a process chamber of a plasma processing apparatus.

The antenna arrangement includes an rf inductive antenna 210 for generating a first rf electromagnetic field extending into the plasma generating region, and passive antennas 220, 222. The passive antennas 220, 222 are inductively coupled to the rf inductive antenna 210 to generate a second rf electromagnetic field. The second rf electromagnetic field modifies the first rf electromagnetic field such that the rf electromagnetic field at the plasma generating region has altered radial and azimuthal distributions to provide a different degree of processing uniformity of the processing apparatus from that in the absence of the passive antennas 220, 222. The rf electromagnetic field distribution at the plasma generating region has a different azimuthal symmetry from that in the absence of the passive antennas 220, 222 to the rf inductive antenna 210.


Inventors:
ARTHUR M HOWALD
ANDRAS KUTHI
MARK HENRY WILLCOXSON
ANDREW D BAILEY III
Application Number:
JP2011279987A
Publication Date:
May 31, 2012
Filing Date:
December 21, 2011
Export Citation:
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Assignee:
LAM RES CORP
International Classes:
H05H1/46; H01J37/32; H01L21/3065; H01Q1/26; H01Q7/00; H01Q11/12; H01Q21/29
Attorney, Agent or Firm:
Meisei International Patent Office



 
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