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Title:
METHOD FOR DEPOSITING SILICON-BASED THIN FILM, METHOD FOR DEPOSITING SILICON-BASED SEMICONDUCTOR LAYER AND PHOTOVOLTAIC ELEMENT
Document Type and Number:
Japanese Patent JP2002206168
Kind Code:
A
Abstract:

To provide a method for depositing a silicon semiconductor layer having excellent photoelectric characteristics at a film deposition rate of an industrially practical level and also to provide a photovoltaic element in which the silicon-based semiconductor layer deposited by the method is used.

In this method, raw-material gas is introduced into a vacuum vessel to deposit the silicon-based semiconductor layer containing a microcrystal on a substrate introduced into the vacuum vessel by a plasma-enhanced CVD method. This method comprises a first step where a first region is deposited by using the raw-material gas containing halogen atoms and a second step where a second region is deposited on the above first region under the condition that the amount of the raw-material gas containing halogen atoms is smaller than that used in the above first step.


Inventors:
KONDO TAKAHARU
YAMASHITA TOSHIHIRO
SANO MASAFUMI
HAYASHI SUSUMU
TAKAI YASUYOSHI
SAKAI AKIRA
Application Number:
JP2001325691A
Publication Date:
July 26, 2002
Filing Date:
October 23, 2001
Export Citation:
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Assignee:
CANON KK
International Classes:
C23C16/24; C23C16/505; C23C16/511; C30B25/10; H01L21/205; H01L31/0224; H01L31/0368; H01L31/0392; H01L31/04; H01L31/18; (IPC1-7): C23C16/24; H01L21/205; H01L31/04
Attorney, Agent or Firm:
Fukumori Hisao