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Patent Searching and Data


Title:
METHOD FOR DETERMINING MEASURING QUANTITY AND CIRCUIT APPARATUS FOR IMPLEMENTING THE SAME
Document Type and Number:
Japanese Patent JPH05196510
Kind Code:
A
Abstract:

PURPOSE: To remove effect as caused by a thermoelectromotive force in a lead to individual resistances and a contact potential at a switch.

CONSTITUTION: This method is to determine a voltage drop in a stabilized reference resistance of a temperature characteristic for the measurement of temperature. In this method, four voltage drops are measured and a difference is formed from two each of the voltage drops. A quotient is obtained from the difference using it as yardstick for a measuring quantity. In this manner, the four voltage drops are determined to obtain a voltage drop. Hence, a measuring current (Im+) flows through a measuring resistance and a negative measuring current(Im-)flows through a measuring resistance. The positive measuring current (Im+) flows through a reference resistance and the negative measuring current (Im-) flows through the reference resistance. Then, a difference is generated between first and second measured values, a difference is generated between third and fourth measured values and then, a quotient is formed between both the differences.


Inventors:
HANSU REOPORUTO
HANSU SHIYUTABINGAA
KURAUSU PEETAA SHIYURETSUKAA
Application Number:
JP21604092A
Publication Date:
August 06, 1993
Filing Date:
August 13, 1992
Export Citation:
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Assignee:
HANSU REOPORUTO
HANSU SHIYUTABINGAA
International Classes:
G01D3/028; G01K7/20; G01R27/14; G01D3/02; (IPC1-7): G01D3/02; G01D3/04; G01K7/20
Attorney, Agent or Firm:
Toshio Yano (1 outside)