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Patent Searching and Data


Title:
METHOD AND DEVICE FOR DETECTING ABNORMALITY FOR ELECTRIC CIRCUIT
Document Type and Number:
Japanese Patent JP2005091316
Kind Code:
A
Abstract:

To provide an abnormality detecting device capable of detecting an abnormality of a plurality of circuits to be inspected with no switching operation or switching means.

An abnormality detecting device 10 comprises a resistance measuring device 13 for measuring electric resistance value of a parallel test circuit 12 where a plurality of test unit circuit parts 16 of the same electric resistance value are connected each other, a judging circuit 18 for judging whether abnormality has occurred at the test unit circuit part 16 based on the resistance value measured with the resistance measuring device, and a display part 19. The judging circuit 18 compares a calculation part 18a for calculating a variation amount of measured resistance values with the resistance measuring device 13, to the calculation result of the calculation part, and to a total tolerance difference α which is a threshold value. When the variation amount is judged to have exceeded that total tolerance difference α, the display part 19 displays that an abnormality has occurred.


Inventors:
TAKADA HIROMI
ISODA MASASHI
Application Number:
JP2003328881A
Publication Date:
April 07, 2005
Filing Date:
September 19, 2003
Export Citation:
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Assignee:
RICOH KK
International Classes:
G01R31/00; G01R27/02; (IPC1-7): G01R31/00; G01R27/02
Attorney, Agent or Firm:
Tamio Nishiwaki