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Title:
METHOD AND DEVICE FOR DETECTING ABNORMALITY
Document Type and Number:
Japanese Patent JPH05197891
Kind Code:
A
Abstract:

PURPOSE: To optimumly converge all the learning patterns at high speed by correcting a parameter concerning learning while using fuzzy inference.

CONSTITUTION: The presence/absence of abnormality in an object is judged by providing a monitor device to photograph the object to be monitored and a hierarchical neural network device equipped with a learning function to fetch the photographed image data of this monitor device and to input the luminance and/or hue of the image data. A neural network composed of an S layer to input the 100 numerical values of luminance, A layer to input 30 numerical values and R layer composed of two neurons is constituted for each learning pattern, for example, and parameters α and β are optimumly adjusted concerning the corrected amount of synapus load last time and corrected amount based on error at that time. In this case, the parameters α and β are optimumly adjusted concerning all the learning patterns by using fuzzy inference at a fuzzy inference equipment.


Inventors:
YAMAMOTO TAKAYOSHI
NAKAHARA ATSUSHI
Application Number:
JP4689591A
Publication Date:
August 06, 1993
Filing Date:
March 12, 1991
Export Citation:
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Assignee:
BABCOCK HITACHI KK
International Classes:
G05B23/02; G06F9/44; G06F15/18; G06N3/00; G06N99/00; G06T1/00; G08B25/00; G08B31/00; (IPC1-7): G05B23/02; G06F9/44; G06F15/18; G06F15/62; G08B31/00
Attorney, Agent or Firm:
Kawakita Takecho