Title:
METHOD AND DEVICE FOR DETECTING LOCAL OUTLIER
Document Type and Number:
Japanese Patent JP2009010405
Kind Code:
A
Abstract:
To provide a suitable method and a device for detecting a local outlier.
The method and the device for data analysis according to various aspects are so constituted that a statistical outlier which includes a local outlier for showing an outlier in a subset of larger data population at testing data of a component can be identified. The test system includes a tester for testing a set of components and generating test data, and a local outlier identifying system for selecting data sub-set from the test data and identifying the local outlier in the data sub-set automatically.
Inventors:
MIGUELANEZ EMILIO
GORIN JACKY
TABOR ERIC PAUL
GORIN JACKY
TABOR ERIC PAUL
Application Number:
JP2008209262A
Publication Date:
January 15, 2009
Filing Date:
August 15, 2008
Export Citation:
Assignee:
TEST ADVANTAGE INC
International Classes:
H01L21/66; G01R31/28
Attorney, Agent or Firm:
Hidesaku Yamamoto
Takaaki Yasumura
Natsuki Morishita
Takaaki Yasumura
Natsuki Morishita
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