Title:
METHOD AND DEVICE FOR DIAGNOSIS SENSOR
Document Type and Number:
Japanese Patent JP2010276339
Kind Code:
A
Abstract:
To provide a method and device for diagnosing a sensor for determining kind of abnormality.
Abnormality data are prepared, by estimating data distribution on an abnormal state from previously set normality data, and it is determined as to which of the distribution of the normality data and that of the abnormality data, a plurality of sets of input diagnosis data are closer, while the state of the diagnosis data is determined; and based on the state of the diagnosis data and the state of the diagnosis data in the past, the kind of abnormality of the sensor is determined.
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Inventors:
Kaneda, Masaki
Fushimi, Atsushi
Arita, Setsuo
Fushimi, Atsushi
Arita, Setsuo
Application Number:
JP2009000125951
Publication Date:
December 09, 2010
Filing Date:
May 26, 2009
Export Citation:
Assignee:
HITACHI-GE NUCLEAR ENERGY LTD
International Classes:
G01M19/00