To provide a radiation discriminating/measuring device for irradiating a measuring object and discriminating and measuring α rays, β rays, γ rays, neutron beams, and X-rays contained in the obtained radiation.
The measuring object 4, a first scintillator 7, a second scintillator 8, and a third scintillator 9 are arranged in a radiation irradiation region radiated from a radiation source. A light beam of a first wavelength region is emitted by the first scintillator 7, a light beam of a second wavelength region is emitted by the second scintillator 8, and a light beam of a third wavelength region is emitted by the third scintillator 9. The light emissions by the first, second and third scintillators are recognized by wavelength, and corrected. Measurements according to the types of the radiation are discriminated by wavelength and are performed simultaneously, thereby discriminating and measuring the types of the radiation, namely α rays, β rays, γ rays, neutron beams, and X-rays.
TAKAHARA TAKESHI
FUKUDA KOYO
KONAGAI CHIKARA
| JPS61184444A | 1986-08-18 | |||
| JPS6312179A | 1988-01-19 | |||
| JPH04290985A | 1992-10-15 | |||
| JPS61184444A | 1986-08-18 | |||
| JPS6312179A | 1988-01-19 | |||
| JPH04290985A | 1992-10-15 |
Shunguchi Sekiguchi
Next Patent: CORRECTED CONCENTRIC SPECTROMETER