METHOD AND DEVICE FOR IMPLEMENTING SIGNAL-DEPENDENT OFFSET AND GAIN ADJUSTMENT FOR SOLID-STATE X-RAY DETECTOR

Title:

METHOD AND DEVICE FOR IMPLEMENTING SIGNAL-DEPENDENT OFFSET AND GAIN ADJUSTMENT FOR SOLID-STATE X-RAY DETECTOR

Document Type and Number:

Japanese Patent JP2003303991

Kind Code:

A

Abstract:

To shorten a signal conversion time (150) of a solid-state detector panel (24) of a diagnostic X-ray system (5) for increasing the frame rate.

The measurement of a set of induced signal offsets, caused by time varying change retention associated with a detector panel (24), is performed during a pseudo-time segment (120), prior to normal signal readout (115) of the detector panel 24 for a current image frame. Then, a set of adjustment values is generated, in response to the set of the induced signal offsets. Subsets of a plurality of signal values of the detector panel (24) are read out to a predetermined signal dynamic range as a part of the normal signal readout (115) of the detector panel (24), in response to the set of the adjustment values, thus generating a set of normalized detector signals.

Inventors:

PETRICK SCOTT W
SAUNDERS ROWLAND FREDERICK
CRONCE RICHARD GORDON
KAUTZER JEFFREY A

Application Number:

JP2003086742A

Publication Date:

October 24, 2003

Filing Date:

March 27, 2003

Export Citation:

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Assignee:

GE MED SYS GLOBAL TECH CO LLC

International Classes:

H04N5/30; G01T1/20; H01L31/09; H04N5/32; H04N5/378; A61B6/00; (IPC1-7): H01L31/09; H04N5/30

Attorney, Agent or Firm:

Kenichi Matsumoto (2 outside)

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