Title:
METHOD AND DEVICE FOR ION TRAP MASS SPECTROMETRY
Document Type and Number:
Japanese Patent JP3946162
Kind Code:
B2
Abstract:
PROBLEM TO BE SOLVED: To provide a device for ion trap mass spectrometry capable of improving the sensitivity of MSn analysis of an ion trap mass spectrometry device.
SOLUTION: A first ion guide 21, a slit electrode 22, and a second ion guide 23 are provided in a previous stage of an ion trap 31, for rapidly accelerating ion to cause a collision induction dissociation. A sample separated in a separation column 4 is ionized by an ion source 5, and the collision induction dissociation is caused by the first ion guide 21, the slit electrode 22 and the second ion guide 23 to perform MS2. The ion through MS2 is introduced to the ion trap 31, to perform MS3 in the ion trap 31. By limiting the operation inside the ion trap 31 to MS3, the operation time of the ion trap 31 is reduced to increase the number of operations in a certain period of time, thus made possible to improve detection sensitivity.
Inventors:
Hiroyuki Yasuda
Terui Yasushi
Shinji Nagai
Terui Yasushi
Shinji Nagai
Application Number:
JP2003133504A
Publication Date:
July 18, 2007
Filing Date:
May 12, 2003
Export Citation:
Assignee:
Hitachi High-Technologies Corporation
International Classes:
G01N27/62; H01J49/42; H01J49/06; (IPC1-7): H01J49/42; G01N27/62; H01J49/06
Domestic Patent References:
| JP2002517070A | ||||
| JP2003016992A | ||||
| JP2003501790A |
Attorney, Agent or Firm:
Kasuga Toshiaki