Title:
METHOD AND DEVICE FOR MEASURING BIT ERROR RATE DEPENDING ON LAYER
Document Type and Number:
Japanese Patent JP3508841
Kind Code:
B2
Abstract:
PROBLEM TO BE SOLVED: To provide a method and device for measuring a bit error rate depending on layers that can accurately obtain the bit error rate by each modulation system for hierarchical transmission.
SOLUTION: Transmission mode separators 3, 4 separate data before Reed- Solomon error correction and data after the Reed-Solomon error correction on the basis of transmission mode/slot information in TMCC information from a TMCC analyzer 2 according to a transmission mode and a coding rate. Comparators 5, 7, 9, 11 compare the separated data before the Reed-Solomon error correction with the separated data after the Reed-Solomon error correction by the same transmission mode and each coding rate. Error counters 6, 8, 10, 12 count bits dissident through the comparison as error bits so as to obtain the bit error rate by the same transmission mode and by each coding rate.
Inventors:
Ishihara, Kenichi
Wada, Takahiro
Horii, Akihiro
Wada, Takahiro
Horii, Akihiro
Application Number:
JP2000065946A
Publication Date:
March 22, 2004
Filing Date:
March 10, 2000
Export Citation:
Assignee:
KENWOOD CORP
KENWOOD TMI:KK
KENWOOD TMI:KK
International Classes:
G06F11/10; H03M13/01; H03M13/15; H04L1/00; (IPC1-7): H04L1/00; G06F11/10; H03M13/01; H03M13/15
Attorney, Agent or Firm:
砂子 信夫
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