To provide a method and a device for measuring an electrostatic latent image, capable of measuring a highly precise electrostatic latent image by optimizing a measurement image surface to prevent variations in beam diameter.
A device for measuring an electrostatic latent image, which measures the electrostatic latent image on a photoreceptor surface, comprises: an electron gun 11 for electrifying a photoreceptor; an exposure optical system 22 for irradiating the photoreceptor with luminous flux; an acousto-optic deflection element 103 for diffracting the luminous flux in one direction; correction means for correcting field curvature; a polygon mirror 105 for deflecting the diffracted luminous flux in a direction perpendicular to a diffracting direction; the exposure optical system 22 for scanning and exposing the photoreceptor surface by the luminous flux; and a detector 24 for irradiating the exposed photoreceptor with a charged particle beam to detect secondary electrons emitted from the photoreceptor.
SUHARA HIROYUKI
JP2009300535A | 2009-12-24 | |||
JP2002244069A | 2002-08-28 | |||
JPS59160128A | 1984-09-10 | |||
JP2010176094A | 2010-08-12 | |||
JP2008076542A | 2008-04-03 | |||
JPH0416965A | 1992-01-21 | |||
JP2003295696A | 2003-10-15 |
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