Title:
METHOD AND DEVICE FOR TESTING ELECTRONIC DEVICE
Document Type and Number:
Japanese Patent JP3279404
Kind Code:
B2
Abstract:
PURPOSE: To eliminate the need for setting manually and to reduce time required for the analysis of test result by performing testing according to the setting of pseudo environment.
CONSTITUTION: An electronic device body is constituted by connecting CPUs 11-13 and pseudo PKG (interface package) 21-2n with only hardware/software interface functions. Command train data are transmitted for setting the electronic device body to a test state. Then, command train data for setting the state of pseudo PKGs 21-2n are transmitted to the PKG21-2n, the communication state of data from the pseudo PKG21-2n to the CPU 11-13 is traced, the data are stored and incorporated, and then the stored and incorporated data are analyzed when all tests are completed.
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Inventors:
Takashi Yoshitake
Application Number:
JP21801693A
Publication Date:
April 30, 2002
Filing Date:
August 09, 1993
Export Citation:
Assignee:
富士通株式会社
International Classes:
H04L69/40; H04M1/24; G01R31/28; (IPC1-7): H04L29/14; G01R31/28; H04M1/24
Domestic Patent References:
| JP4258067A | ||||
| JP279646A |
Attorney, Agent or Firm:
Tsunenori Hayashi