Title:
自己校正用慣性測定システムの方法及び装置
Document Type and Number:
Japanese Patent JP2005509149
Kind Code:
A
Abstract:
A method for testing inertial measurement devices on a multi-axis rate table without having to utilize slip rings to transfer signals between the inertial measurement devices and remote processors by incorporating a processor internal to the inertial measurement devices and transferring the signals directly to the processors for determining and storing the calibration coefficients of the inertial measurement devices internally so that they are self calibrating.
More Like This:
| WO/2015/017931 | DETERMINING THE DISTANCE OF AN OBJECT TO AN ELECTRONIC DEVICE |
| WO/1999/014558 | CONSOLIDATED LASER ALIGNMENT AND TEST STATION |
Inventors:
Hanze, Joel Gee
Application Number:
JP2003542866A
Publication Date:
April 07, 2005
Filing Date:
November 05, 2002
Export Citation:
Assignee:
Honeywell International Inc.
International Classes:
G01C25/00; G01P21/00; (IPC1-7): G01C25/00
Attorney, Agent or Firm:
Kazuo Shamoto
Tadashi Masui
Yasushi Kobayashi
Akio Chiba
Hiroyuki Tomita
Fujihiro Kanda
Tadashi Masui
Yasushi Kobayashi
Akio Chiba
Hiroyuki Tomita
Fujihiro Kanda