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Title:
METHOD FOR FORMING REFRACTORY METAL NITRIDE FILM
Document Type and Number:
Japanese Patent JP2007281518
Kind Code:
A
Abstract:

To form a refractory metal nitride used as a barrier metal for wiring so as to be low resistance at a low temperature, and perform from the removal of a natural oxide film to the growth of a contact metal and a barrier metal in a pressure-reduced atmosphere, while preventing the adhesion of a reaction product in a chamber when the film is deposited, in regard to a method for forming a refractory metal nitride film having a step of depositing the refractory metal nitride used as a material of the barrier metal.

The method for forming the refractory metal nitride film, in which the refractory metal nitride film is formed according to a chemical vapor phase deposition method by using a source gas and a reduction gas containing a refractory metallic alkyl amino compound, comprises a step of activating the reduction gas.

COPYRIGHT: (C)2008,JPO&INPIT


Inventors:
SUZUKI HISAYA
OBA TAKAYUKI
JINNAI SHINPEI
MURAKAMI MASASHI
Application Number:
JP2007182342A
Publication Date:
October 25, 2007
Filing Date:
July 11, 2007
Export Citation:
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Assignee:
TOKYO ELECTRON LTD
International Classes:
H01L21/285; C23C16/34; H01L21/28; H01L21/3205; H01L23/52
Attorney, Agent or Firm:
Keizo Okamoto