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Title:
METHOD FOR INSPECTING DEEP-DRAWN GOODS
Document Type and Number:
Japanese Patent JPH0634480
Kind Code:
A
Abstract:

PURPOSE: To easily inspect deep-drawn goods, such as a cathode sleeve, etc., for fault by not performing visual inspections by using a stereomicroscope, universal projector, etc., but utilizing a negative pressure.

CONSTITUTION: A packing (cork) 2 is put to the edge section of a deep-drawn cathode sleeve S as a plate made of an elastic material and a tubing 3 is provided at an arbitrary position in the extent of the packing 2 surrounded by the edge section of the sleeve S as an opening. By connecting a suction tube1 extended from a negative pressure source to the opening, the sleeve is inspected for faults and, by utilizing the fact that defective sleeves are dropped by flowing-in air and acceptable sleeves are maintained in attracted states, deep- drawn sleeves are sorted.


Inventors:
WATANABE TERUO
SHIMADA TOSHINORI
OOKASHI SHINICHI
Application Number:
JP19404392A
Publication Date:
February 08, 1994
Filing Date:
July 21, 1992
Export Citation:
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Assignee:
TATSUTA DENSEN KK
International Classes:
G01M3/34; (IPC1-7): G01M3/34
Attorney, Agent or Firm:
Bunji Kamata (2 outside)



 
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