Login| Sign Up| Help| Contact|

Patent Searching and Data


Title:
METHOD AND INSTRUMENT FOR MEASURING FILM FORMING RATE
Document Type and Number:
Japanese Patent JPS62228942
Kind Code:
A
Abstract:

PURPOSE: To exactly and easily measure the rate or speed of forming a film of a high-polymer compsn., more particularly aq. compsn., etc., by measuring the electric resistance, current or conductivity of a thin film layer.

CONSTITUTION: The thin film (a) of the high-polymer compsn. is formed by coating the thin film (a) at a prescribed thickness on release paper (b) and is imposed on an approximately horizontal glass plate (c). A pair of electrodes 1, which consist of a pair of needle-like bodies made of a stainless steel, are spaced from each other at about 10cm and are mounted approximately parallel to an electrode holding body (e) made of acrylic resin by means of a pair of springs (d). A gaseous nitrogen introducing pipe 5 is integrally provided to the electrode holding body (e). The electrodes 1 are connected to an electric resistance meter 2. The electric resistance value is low and approximately constant before the film is formed. The value increases sharply when the film is formed on progression of the evaporation of water. The value attains equil. as the water runs out. The change point thereof is discriminated as the end point of the film formation.


Inventors:
YAMAZAKI KAZUHIRO
CHO YUJI
SUGIYAMA TADASHI
Application Number:
JP7104086A
Publication Date:
October 07, 1987
Filing Date:
March 31, 1986
Export Citation:
Click for automatic bibliography generation   Help
Assignee:
NIPPON CARBIDE KOGYO KK
International Classes:
B05D3/00; B05C21/00; G01N27/04; (IPC1-7): B05C21/00; B05D3/00; G01N27/04