Title:
METHOD AND INSTRUMENT FOR TWO-DIMENSIONALLY ACCURATELY MEASURING COMING FLYING DIRECTION OF GAMMA RAY
Document Type and Number:
Japanese Patent JP2002131440
Kind Code:
A
Abstract:
To provide a two-dimensional accurate measuring instrument for coming flying direction of gamma ray which can obtain the accurate positional information on a gamma ray and is improved in resolution.
The measuring instrument is provided with a converter 2 which is constituted by alternately laminating grid materials 4 each having many through holes 7 divided from each other by partition walls 4A and insulating materials 5 upon another. In each through hole 7, a hollow channel 8 is formed for passing electrons. The instrument is also provided with a two-dimensional electronic measuring instrument 3 on the bottom side of the converter 2.
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Inventors:
KODERA MASATOSHI
WASHIO MASAICHI
WASHIO MASAICHI
Application Number:
JP2000324629A
Publication Date:
May 09, 2002
Filing Date:
October 24, 2000
Export Citation:
Assignee:
UNIV WASEDA
International Classes:
G01T1/28; G01T1/29; (IPC1-7): G01T1/28
Attorney, Agent or Firm:
Ushiki Mamoru
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