Title:
METHOD OF MANUFACTURING PROBE MADE OF IRIDIUM FOR OBSERVATION OF SCANNING TUNNELING MICROSCOPE
Document Type and Number:
Japanese Patent JP2002307247
Kind Code:
A
Abstract:
To provide a method of manufacturing an acute probe made of iridium, easy to handle, for the observation of a scanning tunneling microscope.
In this method of manufacturing the probe made of iridium, used in the scanning tunneling microscope(STM), a calcium chloride solution incorporated with acetone is used as an electrolyte, and a parallel plate type electrodes made of graphite are used as opposed electrodes in electrolytic grinding to manufacture the acute probe made of iridium, easy to handle, by an electrolytic polishing method.
Inventors:
Iwami, Masayuki
Shioda, Shisho
Uehara, Yoichi
Shioda, Shisho
Uehara, Yoichi
Application Number:
JP2001000117776
Publication Date:
October 23, 2002
Filing Date:
April 17, 2001
Export Citation:
Assignee:
JAPAN SCIENCE & TECHNOLOGY CORP
International Classes:
B23H9/08; B21G3/16; B23H3/06; B23H3/08; C25D17/10; C25F3/16; B23H9/00; B21G3/00; B23H3/00; C25D17/10; C25F3/00; (IPC1-7): B23H9/08; B21G3/16; B23H3/06; B23H3/08; C25D17/10; C25F3/16
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