METHOD OF MANUFACTURING PROBE MADE OF IRIDIUM FOR OBSERVATION OF SCANNING TUNNELING MICROSCOPE

Title:

METHOD OF MANUFACTURING PROBE MADE OF IRIDIUM FOR OBSERVATION OF SCANNING TUNNELING MICROSCOPE

Document Type and Number:

Japanese Patent JP3916879

Kind Code:

B

Abstract:

PROBLEM TO BE SOLVED: To provide a method of manufacturing an acute probe made of iridium, easy to handle, for the observation of a scanning tunneling microscope.
SOLUTION: In this method of manufacturing the probe made of iridium, used in the scanning tunneling microscope(STM), a calcium chloride solution incorporated with acetone is used as an electrolyte, and a parallel plate type electrodes made of graphite are used as opposed electrodes in electrolytic grinding to manufacture the acute probe made of iridium, easy to handle, by an electrolytic polishing method.

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Inventors:

Iwami, Masayuki
Shioda, Shisho
Uehara, Yoichi

Application Number:

JP2001000117776

Publication Date:

February 16, 2007

Filing Date:

April 17, 2001

Export Citation:

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Assignee:

JAPAN SCIENCE & TECHNOLOGY CORP

International Classes:

B23H9/08; B21G3/16; B23H3/06; B23H3/08; C25D17/10; C25F3/16; B23H9/00; B21G3/00; B23H3/00; C25D17/10; C25F3/00; (IPC1-7): B23H9/08; B21G3/16; B23H3/06; B23H3/08; C25D17/10; C25F3/16

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