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Title:
METHOD FOR MANUFACTURING PROBE NEEDLE, PROBE NEEDLE AND PROBE DEVICE
Document Type and Number:
Japanese Patent JP2012225865
Kind Code:
A
Abstract:

To provide a method for manufacturing a probe needle by which stable contact is possible, with high hardness and long life.

A method for manufacturing a probe needle includes: a photolithography process of forming a resist pattern 16 having a recess 15 in the shape of the probe needle 10 which should be formed on a substrate 14; an electroforming process of performing electroplating by using nickel sulfamate plating solution in which a carbon nanotube 17 and dispersant for dispersing the carbon nanotube 17 are mixed, and forming a nickel plating body 18 in which the carbon nanotube 17 is mixed in the recess 15 of the resist pattern 16; a process of removing the resist pattern 16; a process of peeling the nickel plating body 18 from the substrate 14; and an etching process of etching nickel at least at the tip part of the obtained nickel plating body 18 to expose the carbon nanotube 17.


Inventors:
ARAI SUSUMU
NAKAMURA MORINOBU
KIMURA HITOMI
Application Number:
JP2011095839A
Publication Date:
November 15, 2012
Filing Date:
April 22, 2011
Export Citation:
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Assignee:
UNIV SHINSHU
SEIKEN CO
International Classes:
G01R1/067; C25D1/00; C25D1/10
Domestic Patent References:
JP2010002391A2010-01-07
JP2010507098A2010-03-04
JP2006085935A2006-03-30
JP2006190652A2006-07-20
JP2006162378A2006-06-22
JP2008163376A2008-07-17
Attorney, Agent or Firm:
Takao Watanuki
Takashi Okamura
Horimai Kazuharu
Yoshihiro Hirai
Masahiko Denda



 
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