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Title:
METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE AND CHEMICALS
Document Type and Number:
Japanese Patent JP2017076817
Kind Code:
A
Abstract:
PROBLEM TO BE SOLVED: To inhibit pattern collapse in dehydration after a liquid treatment.SOLUTION: The method for manufacturing the semiconductor device comprises: a process of adhering a first liquid to a surface of a semiconductor substrate; and a process of replacing the first liquid by a solution where a precipitate is dissolved in a second liquid. The method further comprises a process of vaporizing the second liquid to deposit the precipitate on the surface of the semiconductor substrate; and a process of removing the precipitate by decompressing and/or heating the precipitate and by changing the precipitate from solid to gas.SELECTED DRAWING: Figure 3

Inventors:
IGARASHI JUNICHI
SATO KATSUHIRO
HIRAKAWA MASAAKI
Application Number:
JP2017000596A
Publication Date:
April 20, 2017
Filing Date:
January 05, 2017
Export Citation:
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Assignee:
TOSHIBA CORP
International Classes:
H01L21/304; C07C61/09; H01L21/8242; H01L27/108
Domestic Patent References:
JP2013042093A2013-02-28
JP2013016699A2013-01-24
JP2008010638A2008-01-17
JPH09190996A1997-07-22
Attorney, Agent or Firm:
Patent Business Corporation Sato International Patent Office



 
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