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Title:
METHOD FOR MEASURING DEFLECTION OF STRUCTURE
Document Type and Number:
Japanese Patent JPH03225246
Kind Code:
A
Abstract:

PURPOSE: To measure the deflection of a structure by installing equisectional bar members having the rigidity sufficiently smaller than the rigidity of the structure to be measured to the structure over the entire length thereof in tight contact therewith so as to have the same deflection shape as the deflection shape of the structure and measuring the distributions thereof in the longitudinal (or height) direction of the axial strains thereof, then integrating the distribution.

CONSTITUTION: The equisectional bar members 2 stuck with strain gages are mounted at a suitable intervals to the structure 1 consisting of the simple beam to be measured so as to indicate the same deformation as the deformation of the structure. The distribution as shown in Fig., is obtd. when the axial strains of the bar members are measured while a certain load is held acted on this structure (the deflection is designated as y and the coordinate in the longitudinal or height direction of the structure as x). A deflection angle curve is obtd. when this distribution curve is integrated once by taking y=0 into consideration at boundary conditions x=0 and x=l of the simple beam. A deflection curve is obtd. when the curve is integrated twice.


Inventors:
SASAKI NOBUYUKI
WATANABE TAKEKATA
INOUE KOICHI
Application Number:
JP1893690A
Publication Date:
October 04, 1991
Filing Date:
January 31, 1990
Export Citation:
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Assignee:
MITSUBISHI HEAVY IND LTD
International Classes:
G01B5/30; G01M5/00; (IPC1-7): G01B5/30; G01M5/00
Attorney, Agent or Firm:
Shigefumi Okamoto (1 person outside)



 
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