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Title:
METHOD FOR MEASURING ORIGINAL WAVEFORM OF ELASTIC WAVE AND APPARATUS FOR MEASURING ORIGINAL WAVEFORM OF ELASTIC WAVE
Document Type and Number:
Japanese Patent JP2006084454
Kind Code:
A
Abstract:

To provide a method and apparatus for measuring original waveform of elastic wave capable of accurately measuring and analyzing the original waveform of a minute elastic wave.

A reference object is collided to a predetermined position of a measuring object in a condition such that a minimum point of frequency area of power spectrum of the original waveform of a reference elastic wave generated by this collision is located in a desired frequency, and a response function of a propagation system is determined by use of the original waveform of the reference elastic wave generated by the collision and a measured waveform of the reference elastic wave obtained by measuring the original waveform of the reference elastic wave through the propagation system. The original waveform of a minute elastic wave generated by applying a minute impact force to the predetermined position of the measuring object is determined by use of a measured waveform of the minute elastic wave obtained by measuring the original waveform of the minute elastic wave through the propagation system and the response function.


Inventors:
Arai, Kazuhiro
Application Number:
JP2005000018379
Publication Date:
March 30, 2006
Filing Date:
January 26, 2005
Export Citation:
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Assignee:
CANON INC
International Classes:
G01H17/00; B41J2/05; G01M7/08; B41J2/05; G01H17/00; G01M7/00