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Patent Searching and Data


Title:
METHOD FOR MEASURING PUPIL POSITION AND METHOD FOR MANUFACTURING BIFOCAL LENS
Document Type and Number:
Japanese Patent JP2014085394
Kind Code:
A
Abstract:

To provide a method for measuring a pupil position, capable of accurately and easily measuring a pupil position on a lens surface for each lens region of a bifocal lens.

In a method for measuring a pupil position, first, the subject 2 wearing a spectacle frame 1 is irradiated with strobe light from a distant measuring position and the strobe light reflected from pupils of the subject 2 is photographed by a camera 11 at the distant measuring position. Then, on the basis of image data obtained from the photographing, a right pupil position (X1, Y1) and a left pupil position (X2, Y2) of the subject 2 from a center point O of the spectacle frame 1 are electronically determined. Next, the subject 2 wearing the spectacle frame 1 is irradiated with strobe light from a near measuring position and the strobe light reflected from pupils of the subject 2 is photographed by a camera 11 at the near measuring position. Then, on the basis of image data obtained from the photographing, the right pupil position (X3, Y3) and the left pupil position (X4, Y4) of the subject 2 from the center point O of the spectacle frame are electronically determined.


Inventors:
NAKAMURA SHOICHI
Application Number:
JP2012231911A
Publication Date:
May 12, 2014
Filing Date:
October 19, 2012
Export Citation:
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Assignee:
NAKAMURA SHOICHI
NIPPON ACP KK
International Classes:
G02C13/00; A61B3/113; G02C7/06
Attorney, Agent or Firm:
Yoshiaki Nishiyama
Takenobu Matsumoto