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Title:
METHOD FOR MEASURING REMAINING LIFETIME OF MATERIAL, AND APPARATUS FOR MEASURING REMAINING LIFETIME USING THE SAME
Document Type and Number:
Japanese Patent JP2004003922
Kind Code:
A
Abstract:

To provide a method and an apparatus for measuring the lifetimes of materials and to be applied to metallic materials etc. which are used for high-temperature parts.

In the method, KAM values which indicate the differences in in-crystal orientations in the crystal grains, crystal grain boundaries, etc. of a test material which has consumed its material life time to prepare a master curve which represents the relation between the measured KAM values; the degree of consumption of material lifetimes in a first process. KAM values, which indicate differences in the crystalline orientations of a material to be examined which requires the estimation of the degree of life consumption are measured; and the measured values are substituted into the master curve. By this, it is possible to estimate the degree of the life time consumption of the material to be examined and to predict the remaining lifetime of the material.


Inventors:
ANDO KIYOSHI
KAMATA MASATOMO
Application Number:
JP2002236781A
Publication Date:
January 08, 2004
Filing Date:
August 15, 2002
Export Citation:
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Assignee:
MITSUBISHI HEAVY IND LTD
International Classes:
G01N23/20; (IPC1-7): G01N23/20
Attorney, Agent or Firm:
Toshiro Mitsuishi
Tadahiro Mitsuishi
Yasuyuki Tanaka
Hiroshi Matsumoto