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Patent Searching and Data


Title:
METHOD OF MEASURING SHAPE, AND METHOD OF MANUFACTURING HIGHLY PRECISE LENS
Document Type and Number:
Japanese Patent JP2002213930
Kind Code:
A
Abstract:

To provide an aspherical shape measuring method for measuring an aspherical lens precisely, and a highly precise lens manufacturing method.

In this shape measuring method wherein a phase difference by interference between reflected light from a surface to be examined and reflected light from a Fizeau surface is detected by a detector to measure the shape of the surface to be examined, the surface shape of the surface to be examined is measured by correcting a shape difference from a desired design value of a reference standard to a shape difference with respect to the reference standard of the surface to be examined calculated based on a phase distribution measuring process for the surface, a phase distribution measuring process for a prescribed reference standard, and a phase distribution measured by the two processes, the shape difference from the desired design value of the reference standard is expressed by a rotation-symmetric error component and a non-rotation-symmetric error component, and the rotation-symmetric error component is expressed by a rotation-symmetric error higher-component and a rotation-symmetric error lower-component out of a difference between a phase distribution of a calibration standard preliminarily measured, and a phase distribution of the reference standard.


Inventors:
NAKAYAMA SHIGERU
TAKIGAWA YUICHI
GENMA TAKASHI
Application Number:
JP2001336084A
Publication Date:
July 31, 2002
Filing Date:
November 01, 2001
Export Citation:
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Assignee:
NIKON CORP
International Classes:
G01B11/24; G01M11/00; (IPC1-7): G01B11/24; G01M11/00