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Title:
METHOD FOR MICROSCOPIC EXAMINATION AT VERY LOW TEMPERATURE AND MICROSCOPE USED FOR IT
Document Type and Number:
Japanese Patent JPS59218417
Kind Code:
A
Abstract:

PURPOSE: To perform microscopic examination without clouding an optical system lens and a light source aperture window even at a very low temperature by cooling the atmosphere in a chamber to a prescribed very low temperature required for a pertinent sample and supplying a normal-temperature pressurized dry gas to a gas seal case.

CONSTITUTION: Normal-temperature pressurized dry air is always supplied to a gas seal case 3 through a seal hose 73 and is filled up there. A cooling chamber 2 is cooled preparatorily to a prescribed temperature. The sample of microscopic examination is placed on a slide glass in the cooling chamber 2, and a cover glass is placed on the sample. The cooling chamber 2 is closed with a cover. The temperature of the atmosphere in the cooling chamber 2 is transmitted to a controller 6 by temperature sensors 61 and 62. A control box 7 which receives a command opens solenoid valves 710 and 720 for a prescribed time to send a liquefied nitrogen in a cooling medium vessel 4 into the cooling chamber 2 through heat insulating hoses 71 and 72.


Inventors:
FUSHIYA KEIJI
TAKENAKA IKU
HONDA KOUJI
Application Number:
JP9320283A
Publication Date:
December 08, 1984
Filing Date:
May 25, 1983
Export Citation:
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Assignee:
OSAKA OXYGEN IND
International Classes:
G02B21/28; (IPC1-7): G02B21/28
Domestic Patent References:
JPS423499Y11967-03-01
Attorney, Agent or Firm:
Shusaku Yamamoto



 
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