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Title:
METHOD FOR NONDESTRUCTIVELY MEASURING DISAPPEARED ELECTRON EMITTING MATERIAL MASS OF FLUORESCENT LAMP
Document Type and Number:
Japanese Patent JP3314463
Kind Code:
B2
Abstract:

PURPOSE: To nondestructively measure the disappearance during the life of an electron emitting material mass applied to the electrode filament of a fluorescent lamp.
CONSTITUTION: A DC constant current source 3 and a voltmeter 4 are connected between both ends of a fluorescent lamp having an electrode filament 2 to which an electron emitting material is applied, and a DC constant voltage source 5 and an ammeter 6 are connected in series to the electrode filament 2 on the side of the negative electrode to be measured of the fluorescent lamp 1. While a constant lamp current less than 1.0mA is carried to the fluorescent lamp 1, a constant filament voltage is applied to the electrode filament 2, and the disappearing quantity of the electron emitting material is calculated by use of the difference of respective time integrated values before and after the lighting of the fluorescent lamp 1 in the filament current change from the time when the application of the constant filament voltage to the electrode filament is started to the time when the lamp voltage of the fluorescent lamp 1 is sharply lowered.


Inventors:
Minoru Akeboshi
Akiko Miyake
Ikuhiro Okuno
Application Number:
JP17524893A
Publication Date:
August 12, 2002
Filing Date:
July 15, 1993
Export Citation:
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Assignee:
Matsushita Electric Industrial Co., Ltd
International Classes:
H01J9/42; (IPC1-7): H01J9/42
Domestic Patent References:
JP6275198A
JP286030A
JP4995473A
JP328773B1
Attorney, Agent or Firm:
Fumio Iwahashi (2 others)