To resolve the problem wherein large amount of time and labor are required, when producing a test pattern of a circuit part as object of mask option.

A method is for producing a test pattern used in the case of testing, with a specific test device, integrated circuits produced based on the mask pattern. The information processing device produces in advance, a net list set in non-wired state for a circuit inside, capable of changing wiring and objecting the mask option among the integrated circuits. To make the non-wired state location in the circuit inside in the net list into a wired state, logic synthesis is executed, based on the net list and the wiring information obtained from the mask option data including the wiring information in the circuit inside. A specific simulation is conducted to the net list after the logical synthesis. The test pattern is produced, based on the executed results of the simulation.