METHOD FOR PROTECTION OF SEMICONDUCTOR RELAY SYSTEM

Japanese Patent JP3689280

B2

PROBLEM TO BE SOLVED: To correctly count the number of times of self-interruption due to heat generation of a MOSFET with a heat interruption circuit built in.
SOLUTION: This semiconductor relay system supplies electric power to a load by an ON/OFF control which is conducted by applying charge pump output voltage obtained by stepping up power supply voltage with a charge pump circuit, by means of a microcomputer to the gate of a MOSFET with a heat interruption circuit built in through a driving circuit. The current supplied to the load is detected and, if it is larger than a reference set value higher than a rated current value, a driving circuit is controlled to cut off the voltage applied to the gate of the MOSFET for stopping power supply to the load. When the source voltage occurring on the source side of the MOSFET is detected and a command signal to turn on the MOSFET is outputted from the microcomputer, the number of times when the source voltage occurring on the source side of the MOSFET is lower than the reference voltage value is counted and, if the count reaches the preset number of times, the semiconductor relay system is turned off to prevent generation of resetting.

JPH03178521	POWER SOURCE CIRCUIT
JP4035749	Discharge lamp lighting device
JP2010522531	Error detection in the controller

Akira Baba
Yoshikazu Nagashima
Yoshihiko Mine

JP26943399A

August 31, 2005

September 22, 1999

Click for automatic bibliography generation  

Yazaki Corporation

H02H3/087; H02H7/12; H02H7/20; H03K17/08; H03K17/687; (IPC1-7): H02H7/20; H02H3/087; H03K17/08; H03K17/687

JP8094695A
JP9191556A

Yasushi Kobayashi
Akihiro Otsuka

Previous Patent: DATA CONVERTER, SIGNAL, DATA CONVERSION METHOD, DCE AND GATEWAY

Next Patent: CLEANER FOR BEVERAGE DISPENSER