Title:
METHOD AND SYSTEM FOR EVALUATING MANUFACTURE WORKPLACE
Document Type and Number:
Japanese Patent JP3639466
Kind Code:
B2
Abstract:
PROBLEM TO BE SOLVED: To predict the ratio of defectives to products which are shipped from a factory by determining the degree of influence of a workplace state of a decided level on the shipment of defectives by jobs from the manufacture of manufacture objects to the shipment and predicting the ratio of defectives included in manufacture objects which are shipped.
SOLUTION: A decision means 21 compares information showing a workplace state accepted by an accepting means 20 with definition information of workplace level stored in a storage means 22 to decide the level of a workplace. The storage means 22 stores the definition information of the workplace level and a message. Workplace levels are divided into plural grades according to the degrees of the workplace states. A calculating means 23 for the degree of influence by jobs determines the degree of influence of the decided workplace level on the shipment of defectives by jobs from the manufacture to the shipment of manufacture objects. A defective fraction calculating means 24 obtains the degrees of detective occurrence influence by the jobs calculated by the calculating means 23 from the storage means 22 to calculate the defective fraction of inclusion of defectives in products to be shipped.
Inventors:
Tatsuya Suzuki
Toshijiro Ohashi
Asano Masaaki
Toshijiro Ohashi
Asano Masaaki
Application Number:
JP21719799A
Publication Date:
April 20, 2005
Filing Date:
July 30, 1999
Export Citation:
Assignee:
株式会社日立製作所
International Classes:
B23Q41/08; G05B15/02; G05B19/418; G05B23/02; G06Q10/04; G06Q50/00; G06Q50/04; G06Q90/00; (IPC1-7): G05B23/02; B23Q41/08; G05B15/02; G06F17/60
Domestic Patent References:
| JP10334151A | ||||
| JP7078810B2 |
Attorney, Agent or Firm:
Sanshin Iwao