Title:
METHOD AND SYSTEM FOR INSPECTING CONSTITUTIVE COMPONENT
Document Type and Number:
Japanese Patent JP2004354383
Kind Code:
A
Abstract:
To provide a system 100 and a method for inspecting a component 102.
This system 100 for inspecting the component 102 includes an X-ray source 104 for emitting an X-ray beam 106 to be transmitted through the component 102, and an X-ray detector 108 for detecting the X-ray beam 106 after transmitted through the component 102. The system 100 may includes also processor 124 for converting coordinates on an X-ray detection panel 110 of the X-ray detector 108 for detecting an optional defect into a digital expression 128 in a position on the component 102 of the optional defect.
Inventors:
MOERMOND KEVIN
GALISH ANDY JOSEPH
BREHM JOHN ROBERT
LITTLE FRANCIS H
GRABER DEAN FREDRICH
LA TULIPPE MICHAEL TIMOTHY
MCFARLAND RONALD CECIL
GALISH ANDY JOSEPH
BREHM JOHN ROBERT
LITTLE FRANCIS H
GRABER DEAN FREDRICH
LA TULIPPE MICHAEL TIMOTHY
MCFARLAND RONALD CECIL
Application Number:
JP2004156988A
Publication Date:
December 16, 2004
Filing Date:
May 27, 2004
Export Citation:
Assignee:
GEN ELECTRIC
International Classes:
G01N23/04; (IPC1-7): G01N23/04
Domestic Patent References:
| JPH01299447A | 1989-12-04 | |||
| JPH07153803A | 1995-06-16 | |||
| JPH08141946A | 1996-06-04 | |||
| JP2001337053A | 2001-12-07 | |||
| JPH069574B2 | 1994-02-09 | |||
| JPH10318951A | 1998-12-04 |
Foreign References:
| WO1999054717A2 | 1999-10-28 | |||
| US20020181650A1 | 2002-12-05 |
Attorney, Agent or Firm:
Kenichi Matsumoto
Hirokazu Ogura
Nobukazu Ito
Toshihisa Kurokawa
Hirokazu Ogura
Nobukazu Ito
Toshihisa Kurokawa
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