METHOD AND SYSTEM FOR INSPECTING GAMMA CORRECTION CHARACTERISTIC VARIANCE OF MATRIX TYPE DISPLAY DEVICE AND METHOD AND SYSTEM FOR ADJUSTING GAMMA CORRECTION CHARACTERISTIC VARIATION

Title:

METHOD AND SYSTEM FOR INSPECTING GAMMA CORRECTION CHARACTERISTIC VARIANCE OF MATRIX TYPE DISPLAY DEVICE AND METHOD AND SYSTEM FOR ADJUSTING GAMMA CORRECTION CHARACTERISTIC VARIATION

Document Type and Number:

Japanese Patent JP2004070119

Kind Code:

A

Abstract:

To provide methods and systems for inspecting and adjusting gamma correction characteristic variation of a matrix type display device which can perform inspection and adjustment at low cost irrelevantly to variance unique to a panel in a state in which the inspection and adjustment are hardly influenced by variance in luminance of a light source.

The inspection and adjustment are carried out by comparing luminance in N-gradation display with dither pattern luminance corresponding to N gradations consisting of two gradations which are O gradations and K gradations.

More Like This:

JP5125078	Display elements, color display elements, and methods for manufacturing display elements
JP2019502789	Liquid crystal media and liquid crystal devices
JP3756381	STEAM JETTING NOZZLE AND SUBSTRATE CLEANING DEVICE USING THE SAME

Inventors:

HARADA KENJI
TOMITANI HIROSHI
TERANISHI KENTARO
TERASAKA KIMITAKA

Application Number:

JP2002231138A

Publication Date:

March 04, 2004

Filing Date:

August 08, 2002

Export Citation:

Click for automatic bibliography generation Help

Assignee:

TOSHIBA MATSUSHITA DISPLAY TEC

International Classes:

G02F1/13; G02F1/133; G09G3/20; G09G3/36; H04N17/04; (IPC1-7): G09G3/36; G02F1/13; G02F1/133; G09G3/20; H04N17/04

Attorney, Agent or Firm:

Kenji Yoshitake
Hidetoshi Tachibana
Yasukazu Sato
Hiroshi Yoshimoto
Yasushi Kawasaki

Previous Patent: COPYING CONTROL UNIT AND COPYING APPARATUS

Next Patent: ENCODING DEVICE, DECODING DEVICE AND RECORDING MEDIUM FOR TIME-SERIES SIGNAL