Title:
METHOD FOR TESTING SIGNAL SELECTING CIRCUIT
Document Type and Number:
Japanese Patent JP3174895
Kind Code:
B2
Abstract:
PURPOSE: To improve the reliability of the test result of a signal selecting circuit, and shorten the test time.
CONSTITUTION: A D/A converter 1 is connected to an input terminal 2h to observe the output of an A/D converter 4, one switching element 3h which is evaluated normal is regularly ON. One probe 5a of a DC measuring instrument 5 is connected to the input terminal 2h, and the other probe is successively brought into contact with input terminals 2a-2g to successively supply a DC (direct current) thereto. At this time, switching elements 3a-3g are successively ON, the continuity between terminals and the presence of a leak are observed by the meter of the DC measuring instrument 5 to evaluate the performance of the switching element 3a-3g.
Inventors:
Hideo Matsui
Application Number:
JP11280593A
Publication Date:
June 11, 2001
Filing Date:
May 14, 1993
Export Citation:
Assignee:
Mitsubishi Electric Corporation
International Classes:
G01R31/28; H01H65/00; G01R31/316; (IPC1-7): G01R31/316; H01H65/00
Domestic Patent References:
| JP3293573A | ||||
| JP5887856A | ||||
| JP55121157A |
Attorney, Agent or Firm:
Norio Kawano
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