Title:
周波数ドメイン干渉測定を利用して光学撮像を実行する方法および装置
Document Type and Number:
Japanese Patent JP5411216
Kind Code:
B2
Abstract:
An apparatus and method are provided. In particular, at least one first electro-magnetic radiation may be provided to a sample and at least one second electro-magnetic radiation can be provided to a non-reflective reference. A frequency of the first and/or second radiations varies over time. An interference is detected between at least one third radiation associated with the first radiation and at least one fourth radiation associated with the second radiation. Alternatively, the first electro-magnetic radiation and/or second electro-magnetic radiation have a spectrum which changes over time. The spectrum may contain multiple frequencies at a particular time. In addition, it is possible to detect the interference signal between the third radiation and the fourth radiation in a first polarization state. Further, it may be preferable to detect a further interference signal between the third and fourth radiations in a second polarization state which is different from the first polarization state. The first and/or second electro-magnetic radiations may have a spectrum whose mean frequency changes substantially continuously over time at a tuning speed that is greater than 100 Tera Hertz per millisecond.
Inventors:
Yoon, Suk Hyun
Brett Eugene, Bowma
Thani, Guillermo Jay.
Fitzgerald De Boer, Johannes
Brett Eugene, Bowma
Thani, Guillermo Jay.
Fitzgerald De Boer, Johannes
Application Number:
JP2011168731A
Publication Date:
February 12, 2014
Filing Date:
August 01, 2011
Export Citation:
Assignee:
The General Hospital Corporation
International Classes:
G01N21/17; A61B5/00; G01N21/47; G02B27/48; G01J9/02; G01N21/39
Domestic Patent References:
| JP2000503237A | ||||
| JP10332329A |
Foreign References:
| WO2003062802A2 |
Attorney, Agent or Firm:
Atsushi Aoki
Jun Tsuruta
Tetsuro Shimada
Shimichi Akihisa
Jun Tsuruta
Tetsuro Shimada
Shimichi Akihisa