Title:
異なる深度で干渉計法の深い断面像を連続して記録するための、特に眼を分析するための方法およびデバイス
Document Type and Number:
Japanese Patent JP5756532
Kind Code:
B2
Abstract:
A method and apparatus including an interferometer is provided for sequentially recording interferometric sectional images at different depths, in particular for analyzing an eye. By use of an interferometer, which includes an optical reference path and an optical sample path, a sample beam scans a measuring region of a sample, in particular of an eye, so as to generate a deep sectional image. The optical and geometric paths in a sample arm and/or reference arm of the interferometer can be switched quickly between two or more positions. The path length of the sample beam and/or of the reference beam is changed by way of a path length switching unit, deep sectional images are generated at least at two different depths of the sample, and the change of the path length in the switching unit takes place by deflection of the beam paths to different geometric paths.
Inventors:
Engelhard, Ralph
Dreghe, gerritto
Martensen, Bjorn
Dreghe, gerritto
Martensen, Bjorn
Application Number:
JP2013552138A
Publication Date:
July 29, 2015
Filing Date:
February 03, 2012
Export Citation:
Assignee:
Heidelberg Engineering GM BA
International Classes:
A61B3/10; G01B9/02; G01B11/24
Domestic Patent References:
| JP2011226785A | ||||
| JP2010000191A | ||||
| JP2010158265A | ||||
| JP10267830A | ||||
| JP2009515175A | ||||
| JP2009139117A | ||||
| JP2003329577A |
Attorney, Agent or Firm:
Kawaguchi International Patent Office