Title:
光学素子の光学ゾーンに関連する方法および装置
Document Type and Number:
Japanese Patent JP2006500636
Kind Code:
A
Abstract:
The invention relates to the determination of higher-order aberrations of an optical element over an optical zone that is larger than the typically limited measured zone over which the aberrations are measured. This is accomplished by apparatus, systems, and methods in which, preferably, the Zernike data from an aberration measurement is fit to a conic function. The conic function smoothly and continuously increases or decreases between the measured zone and the optical zone allowing the extrapolated data to accurately determine the aberrations over the optical zone. According to the invention, a plurality of independent conic plus piston sections that vary azimuthally can very accurately describe a wavefront aberration composed of defocus, astigmatism, spherical aberration, secondary astigmatism, and tetrafoil. The description of primary coma and trefoil will not be as good because they vary with the 3order of the radial component. However, the description error is relatively small. A tilt term can be added to account for the tilt component of the coma and trefoil terms.
Inventors:
Altman, Griffith E.
Application Number:
JP2004540064A
Publication Date:
January 05, 2006
Filing Date:
September 10, 2003
Export Citation:
Assignee:
BAUSCH & LOMB INCORPORATED
International Classes:
G02C7/04; A61B3/107; A61F9/00
Attorney, Agent or Firm:
Hidesaku Yamamoto
Takaaki Yasumura
Natsuki Morishita
Takaaki Yasumura
Natsuki Morishita