Title:
センサのパラメータ化のための方法及び装置
Document Type and Number:
Japanese Patent JP5848456
Kind Code:
B2
Abstract:
Sensors in a test bench environment have to be parameterized in advance. This is a complex task that up to now has been performed mostly manually by a test bench engineer. In order to make the parameterization of a sensor (54) easier, it is proposed that the position of the sensor on the object under test (1) be ascertained through suitable localization methods and the ascertained position be compared with geometric data of the object under test (1), from which the position of the sensor (54) on the object under test (1) can be derived, and from this position on the object under test (1), the variable physically measured by the sensor (54) can be assigned to the sensor (54).
Inventors:
Priler Peter
Paul Weber Michael
Fehringer Rupert
Paul Weber Michael
Fehringer Rupert
Application Number:
JP2014536173A
Publication Date:
January 27, 2016
Filing Date:
October 02, 2012
Export Citation:
Assignee:
Ah Fau El Lisz Gesellschaft Mito Beschlenktel Haftung
International Classes:
G01D21/00; G01B21/00
Domestic Patent References:
| JP201019842A |
Foreign References:
| US20060082363 | ||||
| EP1217477A2 | ||||
| EP1048933A1 |
Attorney, Agent or Firm:
Mitsufumi Esaki
Blacksmith
Atsushi Shinohara
Kiyota Eisho
Blacksmith
Atsushi Shinohara
Kiyota Eisho