Title:
スキャンベースの集積回路でスキャンパターンをブロードキャストする方法および装置
Document Type and Number:
Japanese Patent JP4903365
Kind Code:
B2
Abstract:
A broadcaster, system, and method for reducing test data volume and test application time in an ATE (automatic test equipment) in a scan-based integrated circuit. The scan-based integrated circuit contains multiple scan chains, each scan chain comprising multiple scan cells coupled in series. The broadcaster is a combinational logic network coupled to an optional virtual scan controller and an optional scan connector. The virtual scan controller controls the operation of the broadcaster. The system transmits virtual scan patterns stored in the ATE and generates broadcast scan patterns through the broadcaster for testing manufacturing faults in the scan-based integrated circuit. The number of scan chains that can be supported by the ATE is significantly increased. Methods are further proposed to reorder scan cells in selected scan chains, to generate the broadcast scan patterns and virtual scan patterns, and to synthesize the broadcaster and a compactor in the scan-based integrated circuit.
Inventors:
One, Raun Tern (El-Tee)
One, Shin-Po
Wen, Shaochin
Lynn, Men-Chi
Phosphorus, sea horn
Yeah, Dacha
Tsai, Sen-Way
Abdel-Hafez, Kader Es
One, Shin-Po
Wen, Shaochin
Lynn, Men-Chi
Phosphorus, sea horn
Yeah, Dacha
Tsai, Sen-Way
Abdel-Hafez, Kader Es
Application Number:
JP2003566569A
Publication Date:
March 28, 2012
Filing Date:
January 16, 2003
Export Citation:
Assignee:
Syntest Technologies, Inc.
International Classes:
G01R31/28; G01R31/3183; G01R31/319; G01R31/3185
Domestic Patent References:
| JP6213964A | ||||
| JP7296035A |
Attorney, Agent or Firm:
Kazuo Moriya
Hiromichi Watanabe
Hiromichi Watanabe