Title:
薄膜試料のゼーベック係数および熱伝導率を測定する方法および装置
Document Type and Number:
Japanese Patent JP5062753
Kind Code:
B2
Inventors:
Shigeki Tsukui
Application Number:
JP2008053026A
Publication Date:
October 31, 2012
Filing Date:
March 04, 2008
Export Citation:
Assignee:
Osaka Prefectural University
International Classes:
G01N25/00; G01N25/18
Domestic Patent References:
| JP5018913A | ||||
| JP2007024603A | ||||
| JP2000074862A | ||||
| JP6174668A |
Attorney, Agent or Firm:
河▲崎▼ 眞樹