Title:
レーザ走査顕微鏡を用い、材料によって放射、反射及び透過された光の偏光特性を測定する方法及び装置
Document Type and Number:
Japanese Patent JP2004514129
Kind Code:
A
Abstract:
The invention relates to a method and apparatus for determining the polarization properties of light emitted, reflected or transmitted by a material using a laser scanning microscope with the tested material being illuminated point by point with a laser beam of known polarization state. According to the invention the light beam with a polarization state modified by the material or the light emitted by the material is being examined by measuring the intensity of two different polarization components of a selected light beam received from each point of said material essentially at the same time and assigning a signal obtained by processing the two intensity signals to a respective point of an image of said material. The apparatus has a polarization state generator between the laser light source and the material being tested, and a detector in a light beam for determining the intensity of light with a polarization state modified by the material or the intensity of light emitted by the material, the improvement of which is that a means for dividing the polarization components in space or time is used in front of the detector.
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Inventors:
Galabe, Goso
Pomoshi, Iswan
Vice, Georg
Jorgens, Reinhard
Pomoshi, Iswan
Vice, Georg
Jorgens, Reinhard
Application Number:
JP2002542833A
Publication Date:
May 13, 2004
Filing Date:
November 16, 2001
Export Citation:
Assignee:
Carl Zeiss Jena Gamebeher
Majare Tudomanos Accademia Segeddi Biologic Eye Kotsuponuto
Majare Tudomanos Accademia Segeddi Biologic Eye Kotsuponuto
International Classes:
G01J4/04; G01N21/19; G01N21/21; G01N21/23; G01N21/64; G02B21/00; (IPC1-7): G01N21/21; G01J4/04; G01N21/19; G01N21/23; G01N21/64
Attorney, Agent or Firm:
Akira Koike
Eiichi Tamura
Seiji Iga
Eiichi Tamura
Seiji Iga