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Title:
後成的修飾の同定及びモニタリング方法
Document Type and Number:
Japanese Patent JP2009519039
Kind Code:
A
Abstract:
The present invention provides novel methods for identifying and monitoring epigenetic modifications, such as imprinted genes, using microarray based technology. Specifically, the invention detects imprinted genes by the presence of overlapping closed and open chromatin markers. The invention also discloses a method for detecting the loss of imprinting on a genome-wide scale, which is indicative of a variety of medical conditions. Diagnostic assays and chromatin structure markers for identifying gene imprinting and loss thereof are also disclosed.

Inventors:
Green roland dee
Bjornsung Hans Tea
Feinberg Andrew P
Application Number:
JP2008545761A
Publication Date:
May 14, 2009
Filing Date:
December 13, 2006
Export Citation:
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Assignee:
Nimburgen Systems Incorporated
International Classes:
C12Q1/68; C12M1/00; C12N15/09
Other References:
JPN6012022038; 蛋白質核酸酵素 第43巻、第14号, 1998, pp.2101-2108
JPN6012022040; 実験医学 第18巻、第8号, 2000, pp.1076-1080
JPN6012022044; 実験医学 第23巻、第12号, 200507, pp.1952-1954
JPN6012022046; Genomics Vol.83, 2004, pp.349-360
JPN6012022049; Methods Vol.31, 2003, pp.67-75
JPN6012022051; Cancer Res. Vol.62, 2002, pp.6456-6461
JPN6012022023; Mol. Cell. Biol. Vol.25, No.11, 200506, pp.4650-4661
JPN6012022025; Methods Vol.31, 2003, pp.83-89
JPN6012022028; TIBS Vol.22, 1997, pp.128-132
JPN6012022031; Nature Genetics Vol.30, No.1, 2002, pp.77-80
JPN6012022034; PNAS Vol.100, No.11, 2003, pp.6364-6369
JPN6012022036; PNAS Vol.101, No.19, 2004, pp.7398-7403
Attorney, Agent or Firm:
Sadao Kumakura
Nobuo Ogawa
Atsushi Hakoda
Kenji Asai
Koji Hirayama
Gen Tashiro