Title:
MICRO-HARDNESS TESTER
Document Type and Number:
Japanese Patent JP2005274217
Kind Code:
A
Abstract:
To provide a micro-hardness tester having high resolution and a simple structure.
The reflecting surface of a reflector 12 moving together with an indenter 11 is a curved surface. When the indenter 11 is moved by pressing onto a measuring object 30, a laser beam reflected by the reflecting surface is greatly swung. Hereby, even a slight movement of the indenter 11 can be detected largely.
Inventors:
TOKUOKA NOBUYUKI
Application Number:
JP2004084932A
Publication Date:
October 06, 2005
Filing Date:
March 23, 2004
Export Citation:
Assignee:
SHIMADZU CORP
International Classes:
G01N3/42; (IPC1-7): G01N3/42
Attorney, Agent or Firm:
Ryouhei Kobayashi
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