To provide microscope equipment capable of resolving a minute pattern exceeding the theoretical resolution of the microscope equipment, and to provide a resolution inspecting method using the microscope equipment.

The microscope equipment is provided with: a solid-state imaging element having a plurality of pixels; a magnification optical system which forms a magnified image of at least a part of an observation object on the pixels of the solid-state imaging element; and an image processing means which applies an edge emphasizing filter having differentiating effect to an image obtained by the solid-state imaging element and, thereby, obtains an edge emphasized image corresponding to the image, wherein the magnification optical system is provided with a variable magnification optical system for imaging a linear part included in an observation region on the surface of the observation object as an image having a width which exceeds the size of individual pixel constituting the solid-state imaging element and is equal to or less than the width of an area processed by the edge emphasizing filter.