To provide a microscope for observing a sample by either of projected light and transmitted light by arranging the sample between tow objective lenses.
In the case of a field switching type microscope, two objective lenses 2 and 3 of nearly the same optical characteristic data are provided and a mirror 5 is installed in the rear of at least one of these lenses 2 and 3. Then, light transmitted through a sample is returned accurately to an original position by reflection to realize double light transmission to a preparation under the best spatial illumination effect. In the case of a laser scanning microscope, two objective lenses having the same optical characteristic data are similarly provided and a phase conjugate mirror or a compensation mirror is installed in the rear of at least one of the lenses.
WO/1999/052005 | APPARATUS AND METHODS FOR FOURIER SPECTRAL ANALYSIS IN A SCANNING SPOT MICROSCOPE |
WO/2000/019262 | HIGH THROUGHPUT MICROSCOPY |
JP4135283 | Inspection equipment |
WOLLESCHENSKY RALF
JPH09179037A | 1997-07-11 | |||
JPH05288992A | 1993-11-05 | |||
JPH03188408A | 1991-08-16 | |||
JPH0527180A | 1993-02-05 | |||
JPH05203879A | 1993-08-13 | |||
JPS58145911A | 1983-08-31 | |||
JPH0431108A | 1992-02-03 |
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