Title:
MICROSCOPE AND SYSTEM COMPRISING MICROSCOPE FOR EXAMINATION OF INCUBATED SAMPLE AND CORRESPONDING METHOD
Document Type and Number:
Japanese Patent JP2021174008
Kind Code:
A
Abstract:
To provide a microscope (100) for microscopic examination of a sample (120).SOLUTION: A microscope comprises: a microscope housing (102) enclosing an illumination optics (118), a microscope stage (116) and an imaging optics (124); and an integrated sample chamber (106) located within the microscope housing and formed by a separated housing section (104) within the microscope housing. The housing section comprises a lid (109) providing direct access to the microscope stage for placing the sample in the sample chamber. The housing section comprises an interface (108) for connection of an external incubation environment conditioning unit (110) to the sample chamber. The interface is configured to provide a connection between the external incubation environment conditioning unit and the sample chamber. The environmental conditions in the sample chamber can be controlled when the external incubation environment conditioning unit is connected to the interface.SELECTED DRAWING: Figure 1
Inventors:
MARTIN KUBEK
Application Number:
JP2021075080A
Publication Date:
November 01, 2021
Filing Date:
April 27, 2021
Export Citation:
Assignee:
LEICA MICROSYSTEMS
International Classes:
G02B21/24; B01L1/00
Attorney, Agent or Firm:
Einzel Felix-Reinhard
Morita Taku
Junichi Maekawa
Hideo Nagashima
Hiroyasu Ninomiya
Ueshima
Morita Taku
Junichi Maekawa
Hideo Nagashima
Hiroyasu Ninomiya
Ueshima
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