Title:
分解能の向上した顕微鏡法および顕微鏡
Document Type and Number:
Japanese Patent JP5852305
Kind Code:
B2
Abstract:
The method involves producing an illuminating pattern of a sample in a position. Relative shifting perpendicular to an illumination direction is produced between detection and the illuminating pattern with step size below resolution limit of a microscope from the position into another position of the illuminating pattern. Detection signals are detected and stored in the two positions. A high-resolution image is produced by offsetting the stored detection signals, where the pattern consists of point-shaped or linear scanning of the sample and generation of a point pattern or line pattern. An independent claim is also included for a microscope consisting of an illumination light.
Inventors:
Ingo Creppe
Ralph Nets
Yauheny Novikau
Ralph Nets
Yauheny Novikau
Application Number:
JP2010237381A
Publication Date:
February 03, 2016
Filing Date:
October 22, 2010
Export Citation:
Assignee:
CARL ZEISS MICROSCOPY GMBH
International Classes:
G01N21/64; G02B21/06; G02B21/36
Domestic Patent References:
| JP2003255231A |
Attorney, Agent or Firm:
Hironobu Onda
Makoto Onda
Atsushi Honda
Makoto Onda
Atsushi Honda