Title:
顕微分析装置
Document Type and Number:
Japanese Patent JP6583525
Kind Code:
B2
Abstract:
A microscopic analysis apparatus including a concentrating optical system 5 that concentrates measurement light emitted from a sample in a measuring area on a first concentration point, an aperture plate having an opening located at the first concentration point, an elliptical concave mirror 8 that reflects measurement light passing through the opening and concentrates the reflected measurement light on a second concentration point, a shielding plate disposed in front of the second concentration point, a through-hole having an end surface, whose shape coincides with a shape of a cross section of a light flux of measurement light at the position, being formed in the shielding plate, and a photodetector provided at the second concentration point. In this way, it is possible to allow more measurement light to enter the photodetector without allowing light outside the measuring area to enter the photodetector.
Inventors:
Shuhei Okuyama
Application Number:
JP2018500974A
Publication Date:
October 02, 2019
Filing Date:
September 20, 2016
Export Citation:
Assignee:
SHIMADZU CORPORATION
International Classes:
G02B17/08; G02B13/14; G02B21/00; G02B21/02
Domestic Patent References:
| JP2001174708A | ||||
| JP2002188958A | ||||
| JP10104522A | ||||
| JP9274139A |
Attorney, Agent or Firm:
Kyoto International Patent Office